MFP3DInfinity原子力顯微鏡

MFP-3D Infinity

無限應用，無窮潛力

MFP-3D Infinity是MFP-3D Infinity家族中的旗艦產品。它不僅將其歷代產品卓越的多功能性與更高的性能，更強大的功能相結合，還擁有一套重新設計的系統框架，適用于未來拓展。MFP-3D Infinity可以使您日常的成像工作變得更簡單，更迅速地完成，還可以為您zei具雄心地 項目提供支持。

為什么選擇 MFP-3D Infinity？

• 對于大型樣本AFM來說，性能卓越

• 多種選擇，靈活性強，您的想法隨時實現

• 便于適用，無性能損耗

• 提供行業內zei好地 用戶支持

包含模式：

• 接觸模式

• DART?脈沖頻率調制

• 高次諧波成像模式（Dual AC?）

• 雙頻共振追蹤壓電模式（DART）

• 靜電力顯微技術（EFM）

• 液態成像

• 力曲線模式

• 力映射模式（力曲線陣列模式）

• 力調制模式

• 調頻模式

• 開爾文探針力顯微鏡（KPFM）

• 側向力模式（LFM）

• 損耗角正切模式

• 改進調頻制模式（MFM）

• MicroAngelo?（納米光刻／納米操控）

• 相位成像模式

• 壓電響應力顯微鏡模式(PFM)

• 光譜開關PFM

• 輕敲模式（交流電模式）

• 輕敲模式（交流電模式）搭配Q控制器

• 矢量PFM

MFP-3D Infinity?原子力顯微鏡是MFP-3D 系列AFM的旗艦款，也是該系列中性能更為出色的產品。Infinity擁有豐富的成像模式和配件，還具有多功能性、以及一個可確保未來擴展的系統架構。MFP-3D Infinity能夠讓您的常規成像任務變得更簡便、更快速，同時協助您完成更具挑戰性的科研項目。

性能穩定的AFM，支持大尺寸樣品

提供多種選擇和豐富的模式，協助您將構思轉化為結果

易于使用，又不降低靈活性

提供專業的售后支持和服務

特點：

性能穩定的，支持大尺寸樣品

Superior mechanical stability—Noise floor is 33% lower than any other large-sample

Lowest-noise control electronics

Low noise, stability position sensors

Excellent acoustic vibration isolation

Robust construction, dependable performance that thrives in busy labs

提供多種選擇和豐富的模式，協助您將構思轉化為結果

Full suite of nanomechanical characterization modes available for measuring viscoelastic properties (storage/elastic modulus and loss modulus)

Unmatched range of nanoelectrical and electromechanical characterization modes

Numerous environmental accessories for control

Controlled gas or liquid environment options that are simple, safe, and effective

Unique accessories for applying external forces to a wide range of samples

易于使用，又不降低靈活性

ModeMaster? automatically configures software for selected mode

GetReal? automatically calibrates the cantilever spring constant and sensitivity

GetStarted? automatically sets optimal parameters for tapping mode imaging

提供專業的售后支持和服務

Includes a two-year comprehensive warranty

No-charge technical support and expert applications support for life

Extended warranty and repair costs are the lowest in the industry

Precise, Ultra-low Noise

Closed-loop Scanner

X&Y range 90 μm

X&Y sensors<150 pm noise

Z range >15 μm (>40 μm option)

Z sensor<35 pm noise

Low-noise, High Bandwidth OpticaLever

Cantilever deflection sensing uses an inverted

configuration (incident beam off-vertical) to dramatically

reduce interference from light reflected by the sample.

Light source Low-coherence infrared (860 nm)

superluminescent diode, FDA/IEC Class 1M (Non-hazardous)

DC detector noise<10 pm

Detector bandwidth 7 MHz

High Resolution System Performance

DC height noise<20 pm

AC height noise<20 pm

Top-view Optics

Resolution Better than 5 μm

Camera Color, 5 megapixewith digitapan & zoom

Illumination

Type K?hler with aperture and field diaphragms

Source White LED fiber-coupled with SMA connector

Intensity Software controlled

Sample Stage

Sample size Up to 80 mm diameter

Sample thickness Up to 10 mm (up to 27 mm option)

(Noise measurements are quoted as the average deviation

measured with a 1 kHz bandwidth over a ful10 second

period. Specifications assume required vibration and acoustic

isolation in an appropriate laboratory environment.) 

Acoustic and Vibration Isolation

Enclosure

A custom enclosure fully integrates both acoustic and

vibration isolation, part of the Infinity controller electronics,

and the accessory expansion module bay.

Vibration isolation Active vibration isolation provides

superior damping without the instability and compressed

air requirements of passive isolation tables.

Acoustic isolation Rigid, highly damped design provides

effective isolation of acoustic noise in typicalaboratories.

Ergonomics The door of the enclosure effortlessly swings

to the side to open and is reversible to accommodate different

laboratory floor plans. A smaller access window allows users

to reach into the enclosure to make adjustments.

Included Operating Modes

Contact mode; DART? PFM; DuaAC?; DuaAC Resonance

Tracking (DART?); Electric force microscopy (EFM); Fluid

imaging; Force curve mode; Force mapping mode (force

volume); Force modulation; Frequency modulation; Kelvin

probe force microscopy (KPFM); Lateraforce mode (LFM);

Loss tangent imaging; Magnetic force microscopy (MFM);

MicroAngelo (nanolithography / nanomanipulation); Phase

imaging; Piezoresponse force microscopy (PFM); Switching

spectroscopy PFM; Tapping mode (AC mode); Tapping mode

(AC mode) with Q control; Vector PFM

OptionaOperating Modes

AM-FM Viscoelastic Mapping Mode; Band Excitation; Contact

Resonance Viscoelastic Mapping Mode; Fast Force Mapping

Mode; Instrumented nanoindentation; Conductive AFM

(CAFM) with ORCA? and Eclipse? mode; Current mapping

with Fast Force Mapping; ElectrochemicaStrain Microscopy

(ESM); High voltage PFM; iDrive? (magnetically actuated

AC mode in liquid); Nanoscale Time Dependent Dielectric

Breakdown (nanoTDDB); Scanning ThermaMicroscopy

(SThM); Scanning Tunneling Microscopy (STM); Ztherm?

Modulated ThermaAnalysis

Service and Support

Warranty Fultwo-year comprehensive warranty

Support No-charge technicasupport and expert

applications support for the lifetime of the AFM

Temperature and EnvironmentaControl

PolyHeater? – heating up to 400°C

CoolerHeater – heat or coo-30° to 120°C

Humidity Sensing Cel– sealed humidity chamber

ExternaDriving Forces

Variable Field Module 2 – magnetic fields up to 0.8 T

NanoRack? – tensile or compressive stress up to 80 N

High Voltage Field – apply up to ±150 V

Probe Station – apply your own electric signals to samples

Controlled Gas or Liquid Environments

Closed Fluid Cel– perfuse gases or liquids

Fluid CelLite – operate in liquid without perfusion

ElectricaClosed Cel– controlled gas environment

BioHeater? – coverslip-based heater for liquids

Petri Dish Holder – minimizes evaporation from dish

Petri Dish Heater – also heats dish up to 80°C

MicroFlow Cel– smalvolume fluid exchange

Electrochemistry Cel– also available with heating

參考：

　　顯微鏡：第三代平板式、全閉環先進掃描技術平臺

　　1.掃描器：橫向(X-Y)范圍90&micro;m×90&micro;m;豎直(Z)范圍15&micro;m (標配型)或者40&micro;m(選配型)

　　2. 噪聲：垂直(Z)方向上的RMS值<0.3埃 (平均偏差 (Adev) 在0.1Hz-1kHz 帶寬)

　　3. 樣品大小：直徑≤100mm, 厚度≤20mm

　　4.控制器:全數字化、模塊化、可編程控制器，其數據處理能力僅僅受限于計算機的的內存大小(允許連續一千萬點力曲線和>8190 x 8190點高密度像素成像)。允許在5MHz的速度下連續獲得200萬以上的數據。

　　5. MFP-3D可以實現全面的SPM表面表征技術，包括：

　　?輕敲模式(Tapping Mode AFM)-擁有Q-control控制技術

　　?接觸模式(Contact Mode AFM)

　　?定量相位成像模式(Phase Imaging)

　　?橫向力模式(laterial Force Microscopy, LFM)

　　?磁場力顯微技術(Magnetic Force Microscopy, MFM)

　　?掃描隧道顯微技術(Scanning Tunneling Microscopy, STM)

　　? 力調制(Force Modulation)

　　? 靜電力顯微技術(Electric Force Microscopy, EFM)

　　? 表面電勢顯微術(Surface Potential Microscopy)

　　? 動態和靜態力曲線測試(Force-Distance)

　　?力陣列測量(Force Volume Measurement)

　　? 納米壓痕/劃痕(Nanoindenting/Scratching)

　　? 超高分辨率導電顯微技術(ORCA)

　　? 壓電響應模式(Piezo Respnance mode, PR mode)