布魯克ContourGTK三維光學顯微鏡

ContourGT-K 3D Optical Microscope

Combining exceptional profiling performance, convenience, and affordability in one benchtop instrument

The ContourGT-K 3D Optical Microscope is the standard in capability and value for surface profilers. With a variety of 2D/3D measurements, high-resolution imaging, and a user-friendly interface, the system offers uncompromised metrology in a simplified package with a compact footprint. 

提供最全面的表面測量與成像技術

性能卓越、操作簡便的桌上型三維光學顯微鏡

ContourGT-K三維光學顯微鏡完善了表面測量和分析的新標準，這套測量系統擁有工業領先的測量性能和靈活性，采用專利白光干涉技術，超大視野內埃級至毫米級的垂直計量范圍，具有業界最高的垂直分辨率和測量重復性。

憑借其獨特的直觀用戶界面和功能最全的自動化檢測、分析功能，方便用戶快速高效的獲得材料粗糙度、二維/三維表面分析以及高分辨成像，廣泛應用于LED、太陽能電池、薄膜材料、MEMS、精密機械零部件、摩擦磨損等各個領域，滿足各種表面測量的實際需求。

The ContourGT-K 3D Optical Microscope sets a new industry standard in design and cost for surface metrology performance. With exceptional roughness and 2D/3D measurement capabilities, high esolution imaging and the industry’s most advanced user friendly interface, the system offers uncompromised metrology in a simplified package with a compact footprint. The gage-capable ContourGT-K provides intuitive access to an extensive library of pre-programmed filters and analyses for LED, solar cell, thick films, semiconductor, ophthalmic, medical device, MEMS and tribology applications. Boasting unmatched Z-axis resolution and accuracy, the ContourGT-K provides all of the industry recognized advantages of Bruker’s proprietary white light interferometry without the deficiencies of conventional confocal and standard digital microscopes.

Superior Imaging and Resolution

• Best Z resolution independent of magnification

• Largest field of view

• High-stability, vibration-tolerant design

• High-resolution and color camera options

Powerful Measurement and Analysis

• Streamlined interface and intuitive workflow

• Real-time automated measurement optimization

• Extensive library of filters and analysis options

• Customized analysis reporting

Unparalleled Metrology

The ContourGT-K is the culmination of over three decades of proprietary optical innovation and industry leadership in non-contact surface metrology, characterization and imaging. The ContourGT-K exhibits the low noise, high speed, accuracy, and precision results that quantitative metrology requires. With the use of multiple objectives and integrated feature recognition, features can be tracked over a variety of fields of view and at sub-nanometer vertical resolution, providing scale-independent results for quality control and process monitoring applications in very diverse industries.

Unmatched Value and Scalable Options

With thousands of customized analyses and Bruker's simple, powerful Vision64? user interface, the ContourGT-K is optimized for productivity in the lab and on the factory floor. The hardware and software combine to provide streamlined access to top optical performance at price points thousands of dollars lower than is possible for comparable metrology capability. In addition, the ContourGT-K can be significantly extended past the standard platform with field-upgradable addons and application-specific customization packages:

• Fully automated turret and programmable X, Y, Z movement

• Application-specific productivity software